{"id":11460,"date":"2025-10-08T18:33:08","date_gmt":"2025-10-08T11:33:08","guid":{"rendered":"https:\/\/www.its.ac.id\/perpustakaan\/?page_id=11460"},"modified":"2026-02-24T09:11:05","modified_gmt":"2026-02-24T02:11:05","slug":"ieee-its-apc-program3","status":"publish","type":"page","link":"https:\/\/www.its.ac.id\/perpustakaan\/en\/ieee-its-apc-program3\/","title":{"rendered":"IEEE-ITS APC Program#3"},"content":{"rendered":"<p>[vc_row][vc_column width=&#8221;1\/2&#8243;][dot_custom_title position_text=&#8221;left&#8221; font_style=&#8221;AvenirNextLTPro-DemiCn&#8221; title=&#8221;IEEE-ITS APC Program#3&#8243; text_color=&#8221;#013880&#8243; border_color=&#8221;#013880&#8243; font_size=&#8221;10px&#8221;][\/dot_custom_title][vc_column_text]<\/p>\n<p style=\"text-align: justify\">ITS Library in collaboration with IEEE (Institute of Electrical and Electronics Engineers) organizes the Article Processing Charge (APC) Program for ITS academics.<\/p>\n<p style=\"text-align: justify\">The IEEE-ITS APC program is a program that subsidizes article publication costs for authors from the ITS academic community to support an increase in the number of open access (OA) publications in IEEE journals.<\/p>\n<p style=\"text-align: left\"><strong>IEEE-ITS APC Terms and Conditions#3:<\/strong><\/p>\n<ol style=\"text-align: justify\">\n<li>ITS academicians.<\/li>\n<li>Listed as first author and ITS-affiliated correspondence (must use ITS email).<\/li>\n<li>Effective October 1, 2025, as long as APC tokens are available.<\/li>\n<li>Manuscripts or publications submitted must have an ACCEPTED status in an IEEE journal (<em><strong><a href=\"https:\/\/open.ieee.org\/publishing-options\/ieee-title-list\/\" target=\"_blank\" rel=\"noopener\">https:\/\/open.ieee.org\/publishing-options\/ieee-title-list\/<\/a><\/strong><\/em>).<\/li>\n<li>Has not received funding from other sources.<\/li>\n<\/ol>\n<p style=\"text-align: justify\"><strong>Note:<\/strong><\/p>\n<ul style=\"text-align: justify\">\n<li>The program is non-competitive and submissions are accepted as long as APC tokens are available (first come, first served &amp; one token, one paper).<\/li>\n<li>Before the APC process is approved by the administrator, the entire verification process is conducted by IEEE.<\/li>\n<li>The APC funding approval process by the administrator is not related to reviewers and editorial.<\/li>\n<li>If there are additional pages, or others that do not comply with IEEE writing standards will not be accepted, or if there are excess pages, then it is not covered under the APC scheme. Authors will have to add the additional charges themselves.<\/li>\n<li>The quota of APC tokens provided in the IEEE-ITS APC #3 program is 10.<\/li>\n<li>APC tokens that have been used can be seen in the list of documents that received IEEE ITS APCs on the ITS Library website.<\/li>\n<\/ul>\n<p style=\"text-align: justify\">For other information, please contact the contact person: <a href=\"mailto:astutiknq@its.ac.id\" target=\"_blank\" rel=\"noopener\"><em>astutiknq@its.ac.id<\/em><\/a><\/p>\n<p>[\/vc_column_text][\/vc_column][vc_column width=&#8221;1\/2&#8243;][dot_custom_title position_text=&#8221;left&#8221; font_style=&#8221;AvenirNextLTPro-DemiCn&#8221; title=&#8221;Articles that use the IEEE-ITS#3 APC Token&#8221; text_color=&#8221;#013880&#8243; border_color=&#8221;#013880&#8243; font_size=&#8221;5px&#8221;][\/dot_custom_title][vc_column_text]\n<table id=\"tablepress-58\" class=\"tablepress tablepress-id-58\">\n<thead>\n<tr class=\"row-1\">\n\t<th class=\"column-1\"><strong>No<\/strong><\/th><th class=\"column-2\"><strong>Article title<\/strong><\/th><th class=\"column-3\"><strong>Author<\/strong><\/th>\n<\/tr>\n<\/thead>\n<tbody class=\"row-striping row-hover\">\n<tr class=\"row-2\">\n\t<td class=\"column-1\">1<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/stamp\/stamp.jsp?tp=&amp;arnumber=11203990\" target=\"_blank\">DIR-YOLO: Segmentation of Alveolar Bone and Mandibular Canal in CBCT Images for Dental Implant Recommendation<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Mohammad Farid Naufal, Chastine Fatichah, Eha Renwi Astuti And Ramadhan Hardani Putra<\/p><\/td>\n<\/tr>\n<tr class=\"row-3\">\n\t<td class=\"column-1\">2<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11224305\" target=\"_blank\">Dangerous Speech Classification on Twitter Using Multilabel Aspects and Structural Features<\/a><\/p><br \/>\n<\/td><td class=\"column-3\"><p style=\"text-align: justify\">Yulian Findawati, Diana Purwitasari, Agus Budi Raharjo<\/p><\/td>\n<\/tr>\n<tr class=\"row-4\">\n\t<td class=\"column-1\">3<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11250643\" target=\"_blank\">A Maintainability Framework to Ensure the Software Quality in Object-Oriented Programming<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Siti Rochimah, Tiara Rahmania Hadiningrum, Bella Dwi Mardiana; Daniel Oranova Siahaan, Rizky Januar Akbar, Ary Mazharuddin Shiddiqi<\/p><\/td>\n<\/tr>\n<tr class=\"row-5\">\n\t<td class=\"column-1\">4<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11267394\" target=\"_blank\">Augmented Data Low Confidence (ADLC): A Confidence-Driven Data Augmentation Framework with Ensemble Optimization for Enhanced Machine Learning Performance<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Dwi Sunaryono, Riyanarto Sarno, Shoffi Izza Sabilla, Rizqy Ahsana Putri, Taufiq Choirul Amri, Irfan Mirda, Joko Siswantoro<\/p><\/td>\n<\/tr>\n<tr class=\"row-6\">\n\t<td class=\"column-1\">5<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11271502\" target=\"_blank\">Two-Stage Structural Equation Modelling-Artificial Neural Network on Veterinary Telemedicine<\/a><\/p><br \/>\n<\/td><td class=\"column-3\"><p style=\"text-align: justify\">Reny Nadlifatin, Alda Nandini Hadiyanti, Michael Nayat Young, Satria Fadil Persada<\/p><\/td>\n<\/tr>\n<tr class=\"row-7\">\n\t<td class=\"column-1\">6<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11278076\" target=\"_blank\">Transformer Based Single Image 3D Reconstruction for Cultural Artifacts: A Case Study on Balinese Masks<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">I Nyoman Tri Anindia Putra, Anny Yuniarti, Hadziq Fabroyir<\/p><\/td>\n<\/tr>\n<tr class=\"row-8\">\n\t<td class=\"column-1\">7<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11282427\" target=\"_blank\">PEAK-U-Net: A Progressive Edge-Aware Attention KAN U-Net with Sliding Window for Crack Segmentation<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Priyo Suprobo, Andrew Prasetyo, I Ketut Eddy Purnama, Eko Mulyanto Yuniarno<\/p><br \/>\n<\/td>\n<\/tr>\n<tr class=\"row-9\">\n\t<td class=\"column-1\">8<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11267408\" target=\"_blank\">MalQwen: Fine Tuned LLM for Static Android Malware Analysis Report<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Tegar Ganang Satrio Priambodo, Angela Oryza Prabowo, Annisa Dwi Puspitarini, Raihan Adam Handoyo Winarso, Nur Aisyah, Mohammad Yoga Pratama, Diana Purwitasari, Baskoro Adi Pratomo<\/p><\/td>\n<\/tr>\n<tr class=\"row-10\">\n\t<td class=\"column-1\">9<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11316402\" target=\"_blank\">Deep Learning Segmentation Methods for Mandibular Defects from Computed Tomography Images: A Review<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Fahmi Syuhada, Chastine Fatichah, Hadziq Fabroyir<\/p><\/td>\n<\/tr>\n<tr class=\"row-11\">\n\t<td class=\"column-1\">10<\/td><td class=\"column-2\"><p style=\"text-align: justify\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/11321297\" target=\"_blank\">Deep Learning Segmentation Methods for Mandibular Defects from Computed Tomography Images: A Review<\/a><\/p><\/td><td class=\"column-3\"><p style=\"text-align: justify\">Naim Rochmawati, Chastine Fatichah, Bilqis Amaliah, Agus Budi Raharjo, Fr\u00e9d\u00e9ric Dumont, Emilie Thibaudeau<\/p><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<!-- #tablepress-58 from cache --><\/p>\n<p><em><strong>* Current APC token balance = 0<\/strong><\/em>[\/vc_column_text][\/vc_column][\/vc_row]<\/p>\n","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column width=&#8221;1\/2&#8243;][dot_custom_title position_text=&#8221;left&#8221; font_style=&#8221;AvenirNextLTPro-DemiCn&#8221; title=&#8221;IEEE-ITS APC Program#3&#8243; text_color=&#8221;#013880&#8243; border_color=&#8221;#013880&#8243; font_size=&#8221;10px&#8221;][\/dot_custom_title][vc_column_text] ITS Library in collaboration with IEEE (Institute of Electrical and Electronics Engineers) organizes the Article Processing Charge (APC) Program for ITS academics. The IEEE-ITS APC program is a program that subsidizes article publication costs for authors from the ITS academic community to support an increase [&hellip;]<\/p>\n","protected":false},"author":151,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_joinchat":[],"footnotes":""},"class_list":["post-11460","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>IEEE-ITS APC Program#3 - Perpustakaan<\/title>\n<meta name=\"description\" content=\"Perpustakaan ITS adalah pusat informasi modern yang mendukung pendidikan, penelitian, dan inovasi dengan koleksi lengkap\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.its.ac.id\/perpustakaan\/en\/ieee-its-apc-program3\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"IEEE-ITS APC Program#3 - 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